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Ion-beam-induced modification of fullerene films as studied by electron-energy-loss spectroscopy
Hoffman, A., Paterson, P. J. K., Johnston, S. T., Prawer, S.Volume:
53
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.53.1573
Date:
January, 1996
File:
PDF, 107 KB
english, 1996