[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Modeling of MEMS reliability in shock environments
Xu-Wen Fang,, Qing-An Huang,, Jie-Ying Tang,Volume:
2
Year:
2004
Language:
english
DOI:
10.1109/icsict.2004.1436643
File:
PDF, 969 KB
english, 2004