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[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Modeling and verification of industrial flash memories
Ray, Sandip, Bhadra, Jayanta, Portlock, Thomas, Syzdek, RonaldYear:
2010
Language:
english
DOI:
10.1109/isqed.2010.5450498
File:
PDF, 425 KB
english, 2010