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Fast Resistive Reconnection Regime in the Nonlinear Evolution of Double Tearing Modes
Wang, Z. X., Wang, X. G., Dong, J. Q., Lei, Y. A., Long, Y. X., Mou, Z. Z., Qu, W. X.Volume:
99
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/physrevlett.99.185004
Date:
November, 2007
File:
PDF, 1.50 MB
english, 2007