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[IEEE ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings - Bangi, Malaysia (24-26 Nov. 1998)] ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) - Integrated flash memory and logic testing-a high volume, low cost approach
Lee Chan Yuin,, Janaka Low Chee Kong,, Choo Wei Chien,Year:
1998
Language:
english
DOI:
10.1109/smelec.1998.781152
File:
PDF, 329 KB
english, 1998