Laser Simulation Of Single-event Upset In A P-well CMOS...

IEEE Transactions on Nuclear Science 1989 / 02 Vol. 36; Iss. 1

Laser Simulation Of Single-event Upset In A P-well CMOS Counter

Mazer, J.A., Kang, K., Buchner, S.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.1989.574133
Date:
February, 1989
File:
PDF, 303 KB
english, 1989
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