[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Switching constraint-driven thermal and reliability analysis of Nanometer designs
Krishnamoorthy, Srini, Venkatraman, Vishak, Apanovich, Yuri, Burd, Thomas, Daga, AnandYear:
2011
Language:
english
DOI:
10.1109/isqed.2011.5770770
File:
PDF, 613 KB
english, 2011