[IEEE IEEE Holm Conference on Electrical Contacts - Pittsburgh, PA, USA (27-29 Sept. 1993)] Proceedings of IEEE Holm Conference on Electrical Contacts - The effect of SiO/sub 2/ contaminated silver rivets on contact spot degradation under various arcing properties
Francisco, H.A., Koeneke, K., Wallace, J.Year:
1993
Language:
english
DOI:
10.1109/holm.1993.489690
File:
PDF, 2.55 MB
english, 1993