[IEEE 2009 IEEE International Test Conference (ITC) -...

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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - An economical, precise and limited access In-Circuit Test method for pulse-width modulation (PWM) circuits

Yeh, Albert, Chou, Jesse, Lin, Max
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Year:
2009
Language:
english
DOI:
10.1109/test.2009.5355755
File:
PDF, 4.12 MB
english, 2009
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