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[IEEE 2006 IEEE Conference on Radar - Syracuse, NY, USA (April 2006)] 2006 IEEE Conference on Radar - New Aspects to Knowledge-Aided Clutter Analysis
Jylha, J., Kerminen, R., Vihonen, J., Ala-Kleemola, T., Visa, A.Year:
2006
Language:
english
DOI:
10.1109/radar.2006.1631818
File:
PDF, 936 KB
english, 2006