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[IEEE 2012 35th International Spring Seminar on Electronics Technology (ISSE) - Bad Aussee, Austria (2012.05.9-2012.05.13)] 2012 35th International Spring Seminar on Electronics Technology - Risk analysis of reflow technologies in electronics assembly
Jirsa, Jan, Dusek, Karel, Cernek, PetrYear:
2012
Language:
english
DOI:
10.1109/isse.2012.6273134
File:
PDF, 273 KB
english, 2012