[IEEE 2010 3rd Electronic System-Integration Technology Conference (ESTC) - Berlin, Germany (2010.09.13-2010.09.16)] 3rd Electronics System Integration Technology Conference ESTC - Effects of failure criteria on the constant humidity test results
Kokko, Kati, Frisk, LauraYear:
2010
Language:
english
DOI:
10.1109/estc.2010.5642959
File:
PDF, 673 KB
english, 2010