[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller
Maniatakos, Michail, Karimi, Naghmeh, Tirumurti, Chandra, Jas, Abhijit, Makris, YiorgosYear:
2009
Language:
english
DOI:
10.1109/vts.2009.32
File:
PDF, 997 KB
english, 2009