[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa...

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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller

Maniatakos, Michail, Karimi, Naghmeh, Tirumurti, Chandra, Jas, Abhijit, Makris, Yiorgos
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Year:
2009
Language:
english
DOI:
10.1109/vts.2009.32
File:
PDF, 997 KB
english, 2009
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