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[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - NAND/NOR gate polymorphism in low temperature environment
Ruzicka, Richard, Simek, VaclavYear:
2012
DOI:
10.1109/ddecs.2012.6219020
File:
PDF, 643 KB
2012