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[IEEE Technology of Integrated Systems in Nanoscal Era (DTIS) - Cairo, Egypt (2009.04.6-2009.04.9)] 2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era - Efficiency of probabilistic testability analysis for soft error effect analysis: A case study
Vanhauwaert, P., Leveugle, R.Year:
2009
Language:
english
DOI:
10.1109/dtis.2009.4938062
File:
PDF, 1.14 MB
english, 2009