[IEEE 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011 - Baltimore, MD, USA (2011.06.5-2011.06.10)] 2011 IEEE MTT-S International Microwave Symposium - Challenges and approaches to on-chip millimeter wave antenna pattern measurements
Murdock, J. N., Ben-Dor, E., Gutierrez, F., Rappaport, T. S.Year:
2011
DOI:
10.1109/mwsym.2011.5973566
File:
PDF, 42 KB
2011