Improvement in the reliability of lifetime measurements for...

Physical Review A 1999 / 8 Vol. 60; Iss. 2

Improvement in the reliability of lifetime measurements for highly charged ions in the 0.01–100-ns range

Zou, Y., Hutton, R., Huldt, S., Martinson, I., Ando, K., Kambara, T., Oyama, H., Awaya, Y.
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Volume:
60
Language:
english
Journal:
Physical Review A
DOI:
10.1103/physreva.60.982
Date:
August, 1999
File:
PDF, 54 KB
english, 1999
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