A MOSFET model including total dose effects

IEEE Transactions on Nuclear Science 1996 / 6 Vol. 43; Iss. 3

A MOSFET model including total dose effects

Villard, P., Kielbasa, R.
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Volume:
43
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.510717
Date:
June, 1996
File:
PDF, 594 KB
english, 1996
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