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[IEEE 2010 10th IEEE International Conference on Solid Dielectrics (ICSD) - Potsdam, Germany (2010.07.4-2010.07.9)] 2010 10th IEEE International Conference on Solid Dielectrics - Discrete Wavelet Transform analysis under non uniform contaminated conditions for pollution severity estimating
Douar, M. A., Mekhaldi, A., Bouzidi, M. C.Year:
2010
Language:
english
DOI:
10.1109/icsd.2010.5568146
File:
PDF, 333 KB
english, 2010