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Temperature dependent effective process blur and its impact...

Temperature dependent effective process blur and its impact on exposure latitude and lithographic targets using e-beam simulation and proximity effect correction

Eichfeld, Chad M., Lopez, Gerald G.
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Volume:
32
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4896600
Date:
November, 2014
File:
PDF, 1.57 MB
english, 2014
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