Thickness Dependent Phase Behavior of Antiferroelectric...

Physical Review Letters 2009 / 10 Vol. 103; Iss. 18

Thickness Dependent Phase Behavior of Antiferroelectric Liquid Crystal Films

Pan, LiDong, Wang, Shun, Hsu, C. S., Huang, C. C.
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Volume:
103
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/physrevlett.103.187802
Date:
October, 2009
File:
PDF, 641 KB
english, 2009
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