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[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - A comprehensive study of degradation behavior of select transistors in the Charge Trap Flash memories
Choe, Byeong-In, Chang, Sung-Il, Kang, Changseok, Park, Jintaek, Chung, Joohyuck, Park, Youngwoo, Choi, Jungdal, Chung, ChilheeYear:
2010
Language:
english
DOI:
10.1109/imw.2010.5488386
File:
PDF, 521 KB
english, 2010