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[IEEE 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers - Ann Arbor, MI, USA (12-14 Sept. 2001)] 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (IEEE Cat. No.01EX496) - Reliability investigation in SiGe HBT's
Kuchenbecker, J., Borgarino, M., Bary, L., Cibiel, G., Llopis, O., Tartarin, J.G., Graffeuil, J., Kovacic, S., Roux, J.L., Plana, R.Year:
2001
Language:
english
DOI:
10.1109/smic.2001.942353
File:
PDF, 244 KB
english, 2001