[IEEE Comput. Soc. Press Sixth Great Lakes Symposium on VLSI - Ames, IA, USA (22-23 March 1996)] Proceedings of the Sixth Great Lakes Symposium on VLSI - Input pattern classification for transistor level testing of bridging faults in BiCMOS circuits
Menon, S.M., Jayasumana, A.P., Malaiya, Y.K.Year:
1996
Language:
english
DOI:
10.1109/glsv.1996.497622
File:
PDF, 572 KB
english, 1996