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[IEEE 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Zurich, Switzerland (2009.01.12-2009.01.16)] 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Susceptibility of PMOS Transistors under High RF Excitations at Source Pin
Jovic, Ognjen, Stuermer, Uwe, Wilkening, Wolfgang, Maier, Christian, Baric, AdrijanYear:
2009
Language:
english
DOI:
10.1109/emczur.2009.4783475
File:
PDF, 273 KB
english, 2009