[IEEE IEEE International Radar Conference, 2005. -...

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[IEEE IEEE International Radar Conference, 2005. - Arlington, VA, USA (9-12 May 2005)] IEEE International Radar Conference, 2005. - Feature-enhancement of SAR images by Bayesian regularization

Fiani-Nouvel, M.
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Year:
2005
Language:
english
DOI:
10.1109/radar.2005.1435889
File:
PDF, 1.31 MB
english, 2005
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