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[IEEE Twenty Third IEEE/CPMT International Electronics Manufacturing Technology Symposium. 1998 IEMT Symposium - Austin, TX, USA (19-21 Oct. 1998)] Twenty Third IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.98CH36205) - Reliability performance and failure mode of high I/O thermally enhanced ball grid array packages
Coyle, R.J., Ejim, T.I., Holliday, A., Solan, P.P., Dorey, J.K.Year:
1998
Language:
english
DOI:
10.1109/iemt.1998.731089
File:
PDF, 1.51 MB
english, 1998