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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Width minimization in the Single-Electron Transistor array synthesis

Liu, Chian-Wei, Chiang, Chang-En, Huang, Ching-Yi, Wang, Chun-Yao, Chen, Yung-Chih, Datta, Suman, Narayanan, Vijaykrishnan
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Year:
2014
Language:
english
DOI:
10.7873/date.2014.135
File:
PDF, 316 KB
english, 2014
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