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[IEEE 2007 IEEE International Conference on Automation Science and Engineering - Scottsdale, AZ, USA (2007.09.22-2007.09.25)] 2007 IEEE International Conference on Automation Science and Engineering - Automation and yield of micron-scale self-assembly processes
Saeedi, Ehsan, Kim, Samuel S., Etzkorn, James R., Meldrum, Dierdre R., Parviz, Babak A.Year:
2007
Language:
english
DOI:
10.1109/coase.2007.4341776
File:
PDF, 803 KB
english, 2007