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[IEEE 1991 IEEE International SOI Conference - Vail Valley, CO, USA (1-3 Oct. 1991)] 1991 IEEE International SOI Conference Proceedings - Parasitic bipolar transistor induced latch and degradation in SOI MOSFET's
Her, T.-D., Liu, P.S., Quon, D.S., Li, G.P., Kjar, R., White, J.Year:
1991
Language:
english
DOI:
10.1109/soi.1991.162888
File:
PDF, 145 KB
english, 1991