![](/img/cover-not-exists.png)
[IEEE 2010 44th Annual Conference on Information Sciences and Systems (CISS) - Princeton, NJ, USA (2010.03.17-2010.03.19)] 2010 44th Annual Conference on Information Sciences and Systems (CISS) - Concentration of measure for block diagonal matrices with repeated blocks
Rozell, Christopher J., Yap, Han Lun, Park, Jae Young, Wakin, Michael B.Year:
2010
Language:
english
DOI:
10.1109/ciss.2010.5464965
File:
PDF, 4.55 MB
english, 2010