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[IEEE RAMS '06. Annual Reliability and Maintainability Symposium, 2006. - Newport Beach, CA, USA (23-26 Jan. 2006)] RAMS '06. Annual Reliability and Maintainability Symposium, 2006. - Risk assessment when malevolent actions are involved
Bott, T.F., Eisenhawer, S.W.Year:
2006
Language:
english
DOI:
10.1109/rams.2006.1677350
File:
PDF, 307 KB
english, 2006