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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Silicon evaluation of longest path avoidance testing for small delay defects
Ritesh Turakhia,, Daasch, W. Robert, Ward, Mark, Van Slyke, JohnYear:
2007
Language:
english
DOI:
10.1109/test.2007.4437564
File:
PDF, 414 KB
english, 2007