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[IEEE IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives - Atlanta, GA,USA (24-26 Aug. 2003)] 4th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives, 2003. SDEMPED 2003. - Genetic algorithm for parameter identification of SACS motor testing
Xu Dianguo,, Li Yunfeng,, Shi Jingzhuo,, Guo Ning,Year:
2003
Language:
english
DOI:
10.1109/demped.2003.1234554
File:
PDF, 238 KB
english, 2003