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[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - A novel high speed automatic layout system to place and route test structures for parametric test capability
West, Andrew J., Mondal, Samrat, Patra, Devjyoti, Goswami, Kalyan, Sural, ShamikYear:
2008
DOI:
10.1109/icmts.2008.4509316
File:
PDF, 193 KB
2008