Heavy-Ion-Induced Current Transients in Bulk and SOI FinFETs
El-Mamouni, F., Zhang, E. X., Ball, D. R., Sierawski, B., King, M. P., Schrimpf, R. D., Reed, R. A., Alles, M. L., Fleetwood, D. M., Linten, D., Simoen, E., Vizkelethy, G.Volume:
59
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2012.2221478
Date:
December, 2012
File:
PDF, 882 KB
english, 2012