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[IEEE 2014 30th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2014.3.9-2014.3.13)] 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Thermal transient analysis of semiconductor device degradation in power cycling reliability tests with variable control strategies
Sarkany, Zoltan, Vass-Varnai, Andras, Laky, Sandor, Rencz, MartaYear:
2014
Language:
english
DOI:
10.1109/semi-therm.2014.6892246
File:
PDF, 440 KB
english, 2014