![](/img/cover-not-exists.png)
[IEEE 2012 IEEE International Conference on Imaging Systems and Techniques (IST) - Manchester, United Kingdom (2012.07.16-2012.07.17)] 2012 IEEE International Conference on Imaging Systems and Techniques Proceedings - Total variation image reconstruction for electrical capacitance tomography
Chandrasekera, Thusara C., Li, Yi, Dennis, John S., Holland, Daniel J.Year:
2012
Language:
english
DOI:
10.1109/ist.2012.6295573
File:
PDF, 739 KB
english, 2012