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[IEEE 2012 IEEE International Conference on Imaging Systems and Techniques (IST) - Manchester, United Kingdom (2012.07.16-2012.07.17)] 2012 IEEE International Conference on Imaging Systems and Techniques Proceedings - Total variation image reconstruction for electrical capacitance tomography

Chandrasekera, Thusara C., Li, Yi, Dennis, John S., Holland, Daniel J.
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Year:
2012
Language:
english
DOI:
10.1109/ist.2012.6295573
File:
PDF, 739 KB
english, 2012
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