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[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Spectral Signature Calculations for Remote Sensing

Yeary, M., Yu, T.-Y., Nematifar, S., Shapiro, A.
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Volume:
3
Year:
2005
Language:
english
DOI:
10.1109/imtc.2005.1604538
File:
PDF, 395 KB
english, 2005
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