Exposing Reliability/Performance Tradeoff in Non-Volatile...

IEEE Transactions on Device and Materials Reliability 2014 / 03 Vol. 14; Iss. 1

Exposing Reliability/Performance Tradeoff in Non-Volatile Memories Through Erratic Bits Signature Classification

Zambelli, Cristian, Koebernik, Gert, Ullmann, Rudolf, Bauer, Matthias, Tempel, Georg, Di Tano, Fabrizio, Atti, Massimo, Pistone, Francesco Paolo, Siviero, Andrea, Olivo, Piero
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2013.2284639
Date:
March, 2014
File:
PDF, 1.80 MB
english, 2014
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