Modeling charge self-trapping in wide-gap dielectrics:...

Modeling charge self-trapping in wide-gap dielectrics: Localization problem in local density functionals

Gavartin, Jacob L., Sushko, Peter V., Shluger, Alexander L.
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Volume:
67
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.67.035108
Date:
January, 2003
File:
PDF, 252 KB
english, 2003
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