[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - RT-Level Deviation-Based Grading of Functional Test Sequences
Fang, Hongxia, Chakrabarty, Krishnendu, Jas, Abhijit, Patil, Srinivas, Tirumurti, ChandraYear:
2009
Language:
english
DOI:
10.1109/vts.2009.12
File:
PDF, 694 KB
english, 2009