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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Low dose rate test results of national semiconductor's ELDRS-free bipolar comparators LM111 and LM119
Kruckmeyer, Kirby, McGee, Larry, Brown, Bill, Miller, LindaYear:
2009
Language:
english
DOI:
10.1109/radecs.2009.5994726
File:
PDF, 401 KB
english, 2009