[IEEE 2008 17th IEEE International Symposium on the Applications of Ferroelectrics (ISAF) - Santa Re, NM, USA (2008.02.23-2008.02.28)] 2008 17th IEEE International Symposium on the Applications of Ferroelectrics - Discerning the piezoelectric quality of CdS and ZnO crystals and films from etch properties
Hickernell, Fred S.Year:
2008
Language:
english
DOI:
10.1109/isaf.2008.4693802
File:
PDF, 103 KB
english, 2008