Mobility Anisotropy of Electrons in Inversion Layers on Oxidized Silicon Surfaces
Satô, Tai, Takeishi, Yoshiyuki, Hara, Hisashi, Okamoto, YoshihikoVolume:
4
Journal:
Physical Review B
DOI:
10.1103/physrevb.4.1950
Date:
September, 1971
File:
PDF, 1.76 MB
1971