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[IEEE 1993 IEEE International Symposium on Circuits and Systems - Chicago, IL, USA (3-6 May 1993)] 1993 IEEE International Symposium on Circuits and Systems - A systematic method for nonlinear analysis of a class of FET circuits
Losada, C.A., Haigh, D.G., Radmore, P.M.Year:
1993
Language:
english
DOI:
10.1109/iscas.1993.394167
File:
PDF, 413 KB
english, 1993