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[IEEE Comput. Soc. Press EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies - Prague, Czech Republic (2-5 Sept. 1996)] Proceedings of EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies - SCAN/BIST techniques for decreasing test storage and their implications to test pattern generation
Bevacqua, R., Guerrazzi, L., Fummi, F.Year:
1995
Language:
english
DOI:
10.1109/eurmic.1996.546458
File:
PDF, 803 KB
english, 1995