![](/img/cover-not-exists.png)
[IEEE 2008 15th International Conference on Mechatronics and Machine Vision in Practice (M2VIP) - Auckland, New Zealand (2008.12.2-2008.12.4)] 2008 15th International Conference on Mechatronics and Machine Vision in Practice - Surface Roughness Vision Measurement in Different Ambient Light Conditions
Zhang, Zhisheng, Chen, Zixin, Shi, Jinfei, Jia, Fang, Dai, MinYear:
2008
Language:
english
DOI:
10.1109/mmvip.2008.4749497
File:
PDF, 2.23 MB
english, 2008