[IEEE 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014 - Tampa, FL, USA (2014.6.1-2014.6.6)] 2014 IEEE MTT-S International Microwave Symposium (IMS2014) - Non-contact probes for device and integrated circuit characterization in the THz and mmW bands
Caglayan, Cosan, Trichopoulos, Georgios C., Sertel, KubilayYear:
2014
Language:
english
DOI:
10.1109/mwsym.2014.6848606
File:
PDF, 1.07 MB
english, 2014