[IEEE 2008 IEEE 17th Conference on Electrical Performance of Electronic Packaging (EPEP) - San Jose, CA, USA (2008.10.27-2008.10.29)] 2008 IEEE-EPEP Electrical Performance of Electronic Packaging - A parameterized model order reduction technique for efficient solution of FEM eigenvalue problems
Ahmadloo, Majid, Dounavis, AnestisYear:
2008
Language:
english
DOI:
10.1109/epep.2008.4675932
File:
PDF, 416 KB
english, 2008